Test and Measurement

Advantech provides complete data acquisition devices and convenient SDK for semiconductor testing requirements, such as IC testing and wafer prober testing. Semiconductor machines with Dynamic Signal Acquisition (DSA) devices and software packages, like Advantech’s DAQNavi system, can effectively monitor machine status to help improve quality and performance.

DAQNavi users can choose how they would like to implement the software package. 1) Programming through SDK, which gives users the most freedom and development; or 2) Following the process MCM provides, and then set up the complete system.

The DAQNavi software package connects your signal with data analytics and the IoT world. It includes six parts for customers, based on different needs, and features easy-to-use configuration and comprehensive development support tools. The software can easily be deployed in Machine Condition Monitoring, Automated Testing Equipment, and Machine Control scenarios.

Success Case

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Packaging and Testing

Wafer testing requires precise positions to accurately measure electrical characteristics. High intensity digital input and output devices are used to control peripheral limited switches/devices that can precisely position the wafer. Additionally, accurate testing needs analog output to activate and measure electrical characteristics of the wafer. Advantech’s PCIE-1812 and PCIE-1824 DAQ cards can help to fully meet the requirements of this application.

DAQNavi/SDK

DAQ Software Development Kit

ACP-4020 + AIMB-786

Compact 4U Rackmount Chassis with 8th/9th Generation Intel® Core™ ATX Motherboard

PCIE-1753

96-Ch TTL Digital I/O Programmable digital filter function for DI Output status read back

PCIE-1812

250 kS/s, 16-bit, 8-ch, Simultaneous Sampling Multi-function PCI Express DAQ Card

PCIE-1824

16-bit ,32/16-ch Analog Output PCI Express Card

Machine Condition Monitoring

Semiconductor machines are sensitive in wafer processes; any weakness in vibration will affect the entire semiconductor process. Advantech’s PCIE-1802 can help measure extremely weak vibration in the machine. Through vibration monitoring and modeling, it can further provide wafer fabs and other industrial facilities allowing users the ability to know when a certain machine might go down in operation.

Coupled with DAQNavi/MCM, Advantech’s machine condition monitoring software, the full solution below provides an easy procedure for customers to realize successful condition monitoring systems:

Data Acquisition

Time/Frequency Domain Data Pre-Processing

Feature Extraction

Interpretation and Output

External Devices/Cloud Connectivity

Data Visualization